Semiconductor Engineering

Identifying PCB Defects with a Deep Learning Single-Step Detection Model

This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...
Science Daily

Researchers use machine learning to detect defects in additive manufacturing

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
EurekAlert!

Machine learning method accurately predicts metallic defects

For the first time, researchers at the Lawrence Berkeley National Laboratory (Berkeley Lab) have built and trained machine learning algorithms to predict defect behavior in certain intermetallic ...